Space Semiconductor Testing Without a Heavy Ion Accelerator?
April 29, 2025
Dr. Hyukjae Lee of QRT Discusses ‘Advanced Space Semiconductor Reliability Evaluation Technology’
This in-depth interview with Dr. Hyukjae Lee of QRT explores the methodology of evaluating the reliability of space semiconductors, particularly focusing on heavy ion tolerance and laser-based alternative technologies.
It also introduces the upcoming Advanced Space Semiconductor Innovation Conference scheduled for May 20, 2025.
ASSIC 2025 goes beyond a typical technical seminar, providing a platform to discuss key infrastructure for the future space and defense industries.
This event offers technical insights and real-world applicability for companies, researchers, and public institutions interested in space semiconductors.
Don’t miss this free-to-attend event!
Dr. Hyukjae Lee’s presentation is scheduled at 11:50 AM.
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